A new 3-D profilometry based on modulation measurement

被引：37

作者：

Su, XY ^{[1
]}

Su, LK ^{[1
]}

Li, WS ^{[1
]}

Xiang, LQ ^{[1
]}

机构：

[1] Sichuan Univ, Dept Optoelect, Chengdu 610064, Peoples R China

来源：

AUTOMATED OPTICAL INSPECTION FOR INDUSTRY: THEORY, TECHNOLOGY, AND APPLICATIONS II | 1998年 / 3558卷

关键词：

3-D profilometry; modulation; 3-D sensing;

D O I：

10.1117/12.318337

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This article propose a new optical method for 3-D profilometry, it is not based on the conventional method of structured light triangulation, but on modulation measurement(Ne briefly call it MMP). Its main advantage is that it can measure the surface of a testing object in the same direction of projecting light, so it has no the difficulties due to shadow and spatial discontinuity that exist in PMP and FTP methods and needn't to know the phases. We have measured some objects to verify this method and got some meaningful results. The results proved that this method can be useful to 3-D profilometry, 3-D sensing, machine vision and so on.

引用

页码：1 / 7

页数：5