Off-track margin in bit patterned media

被引：23

作者：

Moser, Andreas ^{[1
]}

Hellwig, Olav ^{[1
]}

Kercher, Dan ^{[1
]}

Dobisz, Elisabeth ^{[1
]}

机构：

[1] San Jose Res Ctr, Hitachi Global Storage Technol, San Jose, CA USA

来源：

APPLIED PHYSICS LETTERS | 2007年 / 91卷 / 16期

关键词：

D O I：

10.1063/1.2799174

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

When two dimensional patterns are written into bit patterned media the off-track margin is of great importance. Using a static write/read tester we measure the hard error rate (written-in errors) as a function of the distance from the track center. We observe three different segments. In the track center, the head writes very well and almost no hard errors are observed. At the track edges the hard error rate increases linearly over an interval, which is shown to relate to the off-track margin of the recording system. At larger distances from the track center, no islands are switched. (C) 2007 American Institute of Physics.

引用

页数：3

共 13 条

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