Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

被引：77

作者：

Ellison, David J. ^{[1
]}

Lee, Bumsu ^{[2
]}

Podzorov, V. ^{[2
]}

Frisbie, C. Daniel ^{[1
]}

机构：

[1] Univ Minnesota, Dept Chem Engn & Mat Sci, Minneapolis, MN 55455 USA

[2] Rutgers State Univ, Dept Phys, Piscataway, NJ 08854 USA

来源：

ADVANCED MATERIALS | 2011年 / 23卷 / 04期

基金：

美国国家科学基金会;

关键词：

SELF-ASSEMBLED MONOLAYERS; WATER; POTENTIOMETRY; INTERFACES; DEVICES; DIPOLE;

D O I：

10.1002/adma.201003122

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Kelvin probe force microscopy measurements on rubrene single crystals partially coated with fluorinated and non-fluorinated SAM derivatives are employed to determine the SAM-induced surface potentials caused by an interfacial charge-transfer doping process resulting in an interface dipole. The surface potential and topographic information in turn allow calculation of the effective intramolecular electric fields and carrier densities due to doping in the SAM-modified rubrene crystals.

引用

页码：502 / +

页数：7

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