Spatially resolved measurements of highly conductive and highly resistive grain boundaries using microcontact impedance spectroscopy

被引：32

作者：

Fleig, J ^{[1
]}

Rodewald, S ^{[1
]}

Maier, J ^{[1
]}

机构：

[1] Max Planck Inst Festkorperforsch, D-70569 Stuttgart, Germany

来源：

SOLID STATE IONICS | 2000年 / 136卷

关键词：

grain boundaries; microelectrodes; electrical properties; impedance spectroscopy; AgCl; SrTiO3;

D O I：

10.1016/S0167-2738(00)00522-1

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

Impedance techniques using circular microelectrodes are introduced in order to locally measure grain boundary properties in polycrystalline materials with highly conductive as well as highly resistive grain boundaries. Finite element calculations allow for a discussion of the general aspects, potentials and limits of such measurements and enable a quantitative analysis of local properties. The applicability of the methods are shown by detecting and analyzing highly conductive grain boundaries in AgCl and by locally measuring impedance spectra of highly resistive grain boundaries in acceptor-doped SrTiO3. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：905 / 911

页数：7

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