Multi-scale statistical process monitoring in machining

被引:35
作者
Li, XL [1 ]
Yao, X [1 ]
机构
[1] Univ Birmingham, Sch Comp Sci, CERCIA, Birmingham B15 2TT, W Midlands, England
关键词
condition monitoring; machining processes; statistical process control (SPC); wavelet transform (WT);
D O I
10.1109/TIE.2005.847580
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Most practical industrial process data contain contributions at multiple scales in time and frequency. Unfortunately, conventional statistical process control approaches often detect events at only one scale. This paper addresses a new method, called multiscale statistical process monitoring, for tool condition monitoring in a machining process, which integrates discrete wavelet transform (WT) and statistical process control. Firstly, discrete WT is applied to decompose the collected data from the manufacturing system into uncorrelated components. Next, the detection limits are formed for each decomposed component by using Shewhart control charts. A case study, i.e., tool condition monitoring in turning using an acoustic emission signal, demonstrates that the new method is able to detect abnormal events (serious tool wear or breakage) in the machining process.
引用
收藏
页码:924 / 927
页数:4
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