Tunneling current and surface potential simultaneous measurement using a scanning probe

被引：16

作者：

Majima, Y ^{[1
]}

Miyamoto, S ^{[1
]}

Oyama, Y ^{[1
]}

Iwamoto, M ^{[1
]}

机构：

[1] Tokyo Inst Technol, Dept Phys Elect, Meguro Ku, Tokyo 1528552, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1998年 / 37卷 / 08期

关键词：

tunneling current; Kelvin method; scanning probe; displacement current; scanning tunneling spectroscopy;

D O I：

10.1143/JJAP.37.4557

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A new simultaneous measuring system for tunneling current and surface potential has been developed. The distance (d) between a sample and an electrochemically etched tungsten tip is changed sinusoidally with high precision. The tunneling current flows periodically in accordance with the vibration of the tip when d becomes as small as a few nm. The surface potential is measured using the principle of the Kelvin method in which the displacement current due to the presence of surface potential and the change in capacitance difference between the tip and the sample is detected. Simultaneous measurement of the tunneling current and the displacement current has been attained by utilizing their phase difference in tip vibration. The method for determining the tip radius and d is also presented.

引用

页码：4557 / 4560

页数：4

共 13 条

[1] MICRO KELVIN PROBE FOR LOCAL WORK-FUNCTION MEASUREMENTS [J].