ADVANCES IN MIRROR TECHNOLOGY FOR SYNCHROTRON X-RAY AND LASER APPLICATIONS
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1998年
/
3447卷
关键词:
synchrotron;
LIGA;
micromachining;
multilayer;
D O I:
10.1117/12.331117
中图分类号:
O43 [光学];
学科分类号:
070207 ;
0803 ;
摘要:
This paper describes the beamline optics for deep-etch X-ray lithography (LIGA). In order to obtain a higher reflectivity than that provided by a mirror with a monolayer coating at photon energies of 4 to 6 keV, multilayer mirrors with a constant and graded d-spacing were developed. At an energy of 6 keV, a measured reflectivity of more than 80% and a band width of 1 keV were obtained for a mirror with a Ni/C multilayer coating and a constant d-spacing. Moreover, it was found that, for energies from 4 to 6 keV, a multilayer mirror with a graded d-spacing provided a higher reflectivity and a wider bandwidth than a mirror with a Pt monolayer coating. A multilayer reflection mirror is a promising component of beamline optics for use in microfabrication and the structural analysis of materials.