Nonmechanical grating-generated scanning coherence microscopy

被引:39
作者
Zeylikovich, I [1 ]
Gilerson, A [1 ]
Alfano, RR [1 ]
机构
[1] CUNY City Coll, New York State Ctr Adv Technol Ultrafast Photon M, Inst Ultrafast Spect & Lasers, New York, NY 10031 USA
关键词
D O I
10.1364/OL.23.001797
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A novel method of coherence microscopy with a grating-generated delay Line is demonstrated to produce depth-lateral images without axial or lateral scanning. A new image-reconstruction approach based on random phase modulation of the reference beam is realized. The depth-lateral reflections of test objects are digitally reconstructed with a simple algorithm. (C) 1998 Optical Society of America.
引用
收藏
页码:1797 / 1799
页数:3
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