机构:
CUNY City Coll, New York State Ctr Adv Technol Ultrafast Photon M, Inst Ultrafast Spect & Lasers, New York, NY 10031 USACUNY City Coll, New York State Ctr Adv Technol Ultrafast Photon M, Inst Ultrafast Spect & Lasers, New York, NY 10031 USA
Zeylikovich, I
[1
]
Gilerson, A
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机构:
CUNY City Coll, New York State Ctr Adv Technol Ultrafast Photon M, Inst Ultrafast Spect & Lasers, New York, NY 10031 USACUNY City Coll, New York State Ctr Adv Technol Ultrafast Photon M, Inst Ultrafast Spect & Lasers, New York, NY 10031 USA
Gilerson, A
[1
]
Alfano, RR
论文数: 0引用数: 0
h-index: 0
机构:
CUNY City Coll, New York State Ctr Adv Technol Ultrafast Photon M, Inst Ultrafast Spect & Lasers, New York, NY 10031 USACUNY City Coll, New York State Ctr Adv Technol Ultrafast Photon M, Inst Ultrafast Spect & Lasers, New York, NY 10031 USA
Alfano, RR
[1
]
机构:
[1] CUNY City Coll, New York State Ctr Adv Technol Ultrafast Photon M, Inst Ultrafast Spect & Lasers, New York, NY 10031 USA
A novel method of coherence microscopy with a grating-generated delay Line is demonstrated to produce depth-lateral images without axial or lateral scanning. A new image-reconstruction approach based on random phase modulation of the reference beam is realized. The depth-lateral reflections of test objects are digitally reconstructed with a simple algorithm. (C) 1998 Optical Society of America.