Sub-electron read noise at MHz pixel rates

被引：102

作者：

Mackay, CD ^{[1
]}

Tubbs, RN ^{[1
]}

Bell, R ^{[1
]}

Burt, D ^{[1
]}

Jerram, P ^{[1
]}

Moody, JI ^{[1
]}

机构：

[1] Univ Cambridge, Inst Astron, Cambridge CB3 0HA, England

来源：

SENSORS AND CAMERA SYSTEMS FOR SCIENTIFIC, INDUSTRIAL, AND DIGITAL PHOTOGRAPHY APPLICATIONS II | 2001年 / 4306卷

关键词：

D O I：

10.1117/12.426988

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A radically new CCD development by Marconi Applied Technologies has enabled substantial internal gain within the CCD before the signal reaches the output amplifier. With reasonably high gain, sub-electron readout noise levels are achieved even at MHz pixel rates. This paper reports a detailed assessment of these devices, including novel methods of measuring their properties when operated at peak mean signal levels well below one electron per pixel. The devices are shown to be photon shot noise limited at essentially all light levels below saturation. Even at the lowest signal levels the charge transfer efficiency is good. The conclusion is that these new devices have radically changed the balance in the perpetual trade-off between readout noise and the speed of readout. They will force a re-evaluation of camera technologies and imaging strategies to enable the maximum benefit to be gained from these high-speed, essentially noiseless readout devices. This new LLLCCD technology, in conjunction with thinning (backside illumination) should provide detectors which will be very close indeed to being theoretically perfect.

引用

页码：289 / 298

页数：4