Simulation of field-assisted ion exchange for glass channel waveguide fabrication: Effect of nonhomogeneous time-dependent electric conductivity

被引:20
作者
Cheng, D [1 ]
Saarinen, J [1 ]
Saarikoski, H [1 ]
Tervonen, A [1 ]
机构
[1] OPTONEX LTD, FIN-02101 ESPOO, FINLAND
关键词
ion exchange in glass; gradient-index; optical waveguide; integrated optics;
D O I
10.1016/S0030-4018(97)00013-8
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Nonhomogeneous time-dependent electric conductivity distribution during field-assisted ion exchange in glass is taken into account in the numerical modeling of optical waveguide fabrication. As an example, the influence of the nonhomogeneous conductivity on a buried channel waveguide is studied in detail. It is shown that there is a substantial variation of electric current density during the process, particularly in the waveguide region. The main difference in comparison to the previous more approximative models is seen to be a smaller refractive index increase for the waveguides.
引用
收藏
页码:233 / 238
页数:6
相关论文
共 13 条
[1]   FULL MODELING OF FIELD-ASSISTED ION-EXCHANGE FOR GRADED INDEX BURIED CHANNEL OPTICAL WAVE-GUIDES [J].
ALBERT, J ;
LIT, JWY .
APPLIED OPTICS, 1990, 29 (18) :2798-2804
[2]  
ALBERT J, 1992, INTRO GLASS INTEGRAT, P7
[3]   THEORY OF 2-D ION-EXCHANGE IN GLASS - OPTIMIZATION OF MICROLENS ARRAYS [J].
CANTOR, AJ ;
ABOUELLEIL, MM ;
HOBBS, RH .
APPLIED OPTICS, 1991, 30 (19) :2704-2713
[4]  
Ferziger JH, 1981, NUMERICAL METHODS EN
[5]  
Golub G, 2013, Matrix Computations, V4th
[6]  
HONKANEN S, 1994, SPIE CRITICAL REV OP, P159
[7]  
MASALKAR PJ, 1994, OPTIK, V95, P168
[8]  
MCCOURT M, 1994, SPIE CRITICAL REV OP, P200
[9]   Fast numerical solution of nonlinear diffusion equation for the simulation of ion-exchanged micro-optics components in glass [J].
Saarikoski, H ;
Salmio, RP ;
Saarinen, J ;
Eirola, T ;
Tervonen, A .
OPTICS COMMUNICATIONS, 1997, 134 (1-6) :362-370
[10]   CGS, A FAST LANCZOS-TYPE SOLVER FOR NONSYMMETRIC LINEAR-SYSTEMS [J].
SONNEVELD, P .
SIAM JOURNAL ON SCIENTIFIC AND STATISTICAL COMPUTING, 1989, 10 (01) :36-52