Band gap determination in thick films from reflectance measurements

被引：245

作者：

Kumar, V

Sharma, SK

Sharma, TP ^{[1
]}

Singh, V

机构：

[1] CCS Univ, Dept Phys, Meerut 250004, Uttar Pradesh, India

[2] SG PG Coll, Meerut, Uttar Pradesh, India

来源：

OPTICAL MATERIALS | 1999年 / 12卷 / 01期

关键词：

band gap; screen printing; reflection spectra; semiconductors;

D O I：

10.1016/S0925-3467(98)00052-4

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Spectroscopic techniques are very useful for characterising semiconducting materials. We demonstrate here a new formulation and method for measuring the energy band gap in thick films from the reflectance data. (C) 1999 Elsevier Science B.V All rights reserved.

引用

页码：115 / 119

页数：5

共 7 条

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Heavens O. S., 1955, OPTICAL PROPERTIES T

[2] Structural and optical properties of sintered ZnSxSe1-x films [J].