H2O trapping on various materials studied by AFM and XPS

被引：28

作者：

Chiba, K ^{[1
]}

Ohmori, R ^{[1
]}

Tanigawa, H ^{[1
]}

Yoneoka, T ^{[1
]}

Tanaka, S ^{[1
]}

机构：

[1] Univ Tokyo, Dept Quantum Engn & Syst Sci, Bunkyo Ku, Tokyo 113, Japan

来源：

FUSION ENGINEERING AND DESIGN | 2000年 / 49-50卷

关键词：

AFM; X-ray photoemission spectroscopy; H2O trapping;

D O I：

10.1016/S0920-3796(00)00187-3

中图分类号：

TL [原子能技术]; O571 [原子核物理学];

学科分类号：

0827 [核科学与技术]; 082701 [核能科学与工程];

摘要：

Adsorption and desorption of water on thin films of iron oxide formed on the iron surface were studied by AFM and X-ray photoemission spectroscopy (XPS). The morphological change of iron oxide or water droplets on the surface of iron oxide were observed by AFM. Electronic state of O 1s was observed by XPS after a sample was exposed to distilled water. Several peaks appeared and assignment to oxygen-containing surface species was discussed. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：791 / 797

页数：7

共 6 条

[1]

SCANNING POLARIZATION FORCE MICROSCOPY - A TECHNIQUE FOR IMAGING LIQUIDS AND WEAKLY ADSORBED LAYERS [J].