Polarization measurements of the light scattered by dielectric randomly rough isotropic surfaces

被引：1

作者：

Chaikina, EI ^{[1
]}

Negrete-Regagnon, P ^{[1
]}

Martínez-Niconoff, G ^{[1
]}

Méndez, ER ^{[1
]}

机构：

[1] Ctr Invest Cient & Educ Super Ensenada, Ensenada 22800, Baja California, Mexico

来源：

SCATTERING AND SURFACE ROUGHNESS II | 1998年 / 3426卷

关键词：

light scattering; random surfaces;

D O I：

10.1117/12.328449

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

An experimental investigation of the hemispherical distribution of the light scattered by randomly rough isotropic dielectric surfaces is presented. The surfaces, whose profiles constitute good approximations to Gaussian random processes with Gaussian correlation functions are fabricated in photoresist. The substrates employed in the fabrication of the samples consist of thick parallel plates of filter glass that absorb the incident light and whose refractive index is close to that of photoresist. This allows us to approximate experimentally a situation in which the light is scattered by a randomly rough interface separating; two semi-infinite dielectric media. The results display features that call be attributed to multiple scattering. In particular, a well-defined enhanced backscatering peak is observed in both, the co- and cross-polarized scattering measurements.

引用

页码：153 / 159

页数：7