In-plane periodic bicrystallinity in magnetic thin films

被引：19

作者：

Sussiau, M

NguyenVanDau, F

Galtier, P

Schuhl, A

机构：

[1] U. Mixte de Rech. Thomson CSF-CNRS, Laboratoire Central de Recherches, 91404 Orsay, Domaine de Corbeville

来源：

APPLIED PHYSICS LETTERS | 1996年 / 69卷 / 06期

关键词：

D O I：

10.1063/1.117915

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Magnetic thin films have been deposited by molecular beam epitaxy on vicinal Si(111) substrates misoriented towards [11-2]. The substrates were thermally pretreated in order to activate the step bunching mechanism, which results in a laterally modulated surface topology with a period of similar to 800 Angstrom. Cobalt or permalloy layers grown on such surfaces exhibit an in-plane uniaxial magnetic anisotropy. This anisotropy is associated with the lateral pseudoperiodic variation of the crystalline orientation of the metallic layers as observed by transmission electron microscopy. Magnetoresistance measurements on microstructured films reveal a single-domain behavior with a magnetization reversal by rotation. (C) 1996 American Institute of Physics.

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页码：857 / 859

页数：3

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