Simulation of the X-ray response of scintillator coated silicon CCDs

被引：26

作者：

Frojdh, C

Nilsson, HE

Nelvig, P

Petersson, CS

机构：

[1] REGAM Med Syst Int AB, S-85238 Sundsvall, Sweden

[2] Mid Sweden Univ, Dept Informat Technol, S-85170 Sundsvall, Sweden

[3] Kungl Tekn Hgsk, Dept Elect, S-16440 Kista, Sweden

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1998年 / 45卷 / 03期

关键词：

D O I：

10.1109/23.682411

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Silicon CCD:s are used for X-ray imaging in fields as dentistry and materials testing. Due to the low X-ray absorption in silicon the CCD is generally coated with a scintillating layer. In order to evaluate the response for different combinations of scintillator material, scintillator geometry and detector we have developed a simulation program. The program calculates the signal to noise ratio and spatial resolution based on both the signal from the scintillating layer and the signal from direct detection of Xrays in the detector. Results obtained with this program indicate that the signal to noise ratio in the system is optimized by using a scintillator with high X-ray absorption and high light output while minimizing the signal from direct detection in the CCD. The spatial resolution can be increased by defining pixels in the scintillator.

引用

页码：374 / 378

页数：5