Wetting-dewetting transition line in thin polymer films

被引:58
作者
Ashley, KM
Raghavan, D [1 ]
Douglas, JF
Karim, A
机构
[1] Howard Univ, Dept Chem, Polymer Program, Washington, DC 20059 USA
[2] Natl Inst Stand & Technol, Div Polymers, Gaithersburg, MD 20899 USA
关键词
D O I
10.1021/la050482y
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Thin polymeric films are increasingly being utilized in diverse technological applications, and it is crucial to have a reliable method to characterize the stability of these films against dewetting. The parameter space that influences the dewetting of thin polymer films is wide (molecular mass, temperature, film thickness, substrate interaction) and a combinatorial method of investigation is suitable. We thus construct a combinatorial library of observations for polystyrene (PS) films cast on substrates having orthogonal temperature and surface energy gradients and perform a series of measurements for a range of molecular masses (1800 g/mol < M < 35 000 g/mol) and film thicknesses h (30 nm < h < 40 nm) to explore these primary parameter axes. We were able to obtain a near-universal scaling curve describing a wetting-dewetting transition line for polystyrene films of fixed thickness by introducing reduced temperature and surface energy variables dependent on M. Our observations also indicate that the apparent polymer surface tension gamma(p) becomes appreciably modified in thin polymer films from its bulk counterpart for films thinner than about 100-200 nm, so that bulk gamma(p) measurements cannot be used to estimate the stability of ultrathin films. Both of these observations are potentially fundamental for the control of thin film stability in applications where film dewetting can compromise film function.
引用
收藏
页码:9518 / 9523
页数:6
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