Structural characterization of various chiral smectic-C phases by resonant X-ray scattering

被引：333

作者：

Mach, P ^{[1
]}

Pindak, R

Levelut, AM

Barois, P

Nguyen, HT

Huang, CC

Furenlid, L

机构：

[1] Univ Minnesota, Sch Phys & Astron, Minneapolis, MN 55455 USA

[2] Lucent Technol, Bell Labs, Murray Hill, NJ 07974 USA

[3] Univ Paris 11, Phys Solides Lab, F-91405 Orsay, France

[4] Univ Bordeaux 1, Ctr Rech Paul Pascal, CNRS, F-33600 Pessac, France

[5] Brookhaven Natl Lab, NSLS, Upton, NY 11973 USA

来源：

PHYSICAL REVIEW LETTERS | 1998年 / 81卷 / 05期

关键词：

D O I：

10.1103/PhysRevLett.81.1015

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We report the results of resonant x-ray diffraction at the sulfur K-edge performed upon free-standing films of a thiobenzoate liquid-crystal compound. Our data provide the first direct structural evidence of distinct periodicities in several chiral Sm-C phases, including 2-layer, 3-layer, and 4-layer superlattices in Sm-C-A*, Sm-C-FI1*, and Sm-C-FI2*, respectively. In Sm-C-alpha*, periodicity incommensurate with the layer spacing was detected. The racemic compound version was also studied. The results are consistent with a "clock model" of the Sm-C* variant structures.

引用

页码：1015 / 1018

页数：4

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