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A low-power low-noise ultrawide-dynamic-range CMOS imager with pixel-parallel A/D conversion

被引：109
作者：
McIlrath, LG [1 ]
机构：
[1] 3DIC Inc, Somerville, MA 02143 USA
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 2001年 / 36卷 / 05期
基金：
美国国家科学基金会;
关键词：
analog-digital conversion; image sensors; sigma-delta modulation; smart pixels;
D O I：
10.1109/4.918924
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A CMOS image sensor with pixel-parallel analog-to-digital (A/D) conversion fabricated with different array sizes and photodiode types in a three-metal 0.5-mum process is presented. Nominal power dissipation is 40 nW per pixel at V-DD = 3,3 V.A/D conversion results from sampling a free-running photocurrent-controlled oscillator to give a first-order Sigma-Delta sequence, The sensor displays dynamic range capability of greater than 150000:1 and exhibits fixed pattern noise correctable to within 0.1% of signal.
引用
收藏
页码：846 / 853
页数：8
相关论文
共 12 条
[1]   A VLSI sorting image sensor: Global massively parallel intensity-to-time processing for low-latency adaptive vision [J].
Brajovic, V ;
Kanade, T .
IEEE TRANSACTIONS ON ROBOTICS AND AUTOMATION, 1999, 15 (01) :67-75
[2]   THE STRUCTURE OF QUANTIZATION NOISE FROM SIGMA-DELTA MODULATION [J].
CANDY, JC ;
BENJAMIN, OJ .
IEEE TRANSACTIONS ON COMMUNICATIONS, 1981, 29 (09) :1316-1323
[3]   A 256x256 CMOS imaging array with wide dynamic range pixels and column-parallel digital output [J].
Decker, S ;
McGrath, RD ;
Brehmer, K ;
Sodini, CG .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1998, 33 (12) :2081-2091
[4]  
FORCHHEIMER R, 1992, P SOC PHOTO-OPT INS, V1659, P2, DOI 10.1117/12.58391
[5]   CMOS image sensors: Electronic camera-on-a-chip [J].
Fossum, ER .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (10) :1689-1698
[6]  
FOWLER B, 1995, THESIS STANFORD U ST
[7]   Design and fabrication of a high-dynamic-range image sensor in TFA technology [J].
Lulé, T ;
Schneider, B ;
Böhm, M .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1999, 34 (05) :704-711
[8]  
MCILRATH LG, UNPUB IEEE T SIGNAL
[9]   A 640 x 512 CMOS image sensor with ultrawide dynamic range floating-point pixel-level ADC [J].
Yang, DXD ;
El Gamal, A ;
Fowler, B ;
Tian, H .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1999, 34 (12) :1821-1834
[10]   A 128x128 pixel CMOS area image sensor with multiplexed pixel level A/D conversion [J].
Yang, DXD ;
Fowler, B ;
ElGamal, A .
PROCEEDINGS OF THE IEEE 1996 CUSTOM INTEGRATED CIRCUITS CONFERENCE, 1996, :303-306
12