Room temperature operated single electron transistor fabricated by electron beam nanolithography

被引:15
作者
Kurihara, K
Namatsu, H
Nagase, M
Makino, T
机构
[1] NTT Basic Research Laboratories, Atsugi-shi, Kanagawa Pref., 3-1, Morinosato Wakamiya
关键词
D O I
10.1016/S0167-9317(96)00093-7
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have fabricated a Si-based single electron transistor (SET) with precisely controlled structure using a newly developed electron beam nanolithography system and a Si nanofabrication process. A Si island and tunnel barriers are fabricated by trench etching with reactive ion etching on a superficial Si layer of SIMOX substrate, combined with an image reversal technique using ECR plasma oxidation. The SET fabricated with this method accommodates a 10-nm Si island and achieved room temperature operation.
引用
收藏
页码:261 / 264
页数:4
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