Fourier transform infrared synchrotron ellipsometry for studying the anisotropy of small organic samples

被引：14

作者：

Hinrichs, K

Gensch, M

Röseler, A

Korte, EH

Sahre, K

Eichhorn, KJ

Esser, N

Schade, U

机构：

[1] Inst Spectrochem & Appl Spect, ISAS, Dept Berlin, D-12489 Berlin, Germany

[2] Polymer Res Inst, D-01062 Dresden, Germany

[3] Tech Univ Berlin, Inst Solid State Phys, D-10623 Berlin, Germany

[4] Synchrotronstrahlung mbH, Berliner Elektronenspeicherring Gesell, D-12489 Berlin, Germany

来源：

APPLIED SPECTROSCOPY | 2003年 / 57卷 / 10期

关键词：

infrared spectroscopic ellipsometry; infrared reflection; absorption spectroscopy; fourier transform infrared; FTIR; organic layer; synchrotron radiation; anisotropy; polymer;

D O I：

10.1366/000370203769699117

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An experimental setup for polarization-dependent and spectroscopic ellipsometric measurements was developed that utilizes the brilliance of synchrotron infrared radiation at the electron storage ring at BESSY II for investigations of small samples and sample areas. During commissioning of the beamline and the experimental setup, a 1 mm(2) piece of a well-characterized polyimide film was studied to show the benefits of Fourier transform infrared (FT-IR) synchrotron ellipsometry. The band shapes are interpreted with respect to the anisotropic distribution of transition dipole moments within the film. In comparison to a globar source, the signal intensity has been improved by more than one order of magnitude for this example.

引用

页码：1250 / 1253

页数：4

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