Field ion microscopy of microdeformation induced by metallic contacts

被引:5
作者
Ohmae, N
机构
[1] Faculty of Engineering, Osaka University, Suita, Osaka
来源
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES | 1996年 / 74卷 / 05期
关键词
D O I
10.1080/01418619608239731
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A field ion microscope has been used to investigate, on an atomic scale, the deformation of micropointed W tips induced by an indentation and adhesion against metal plates. The pull-off forces measured for clean surfaces were far greater than the applied forces, in which cases the deterioration of atomic arrangements extended from the central (011) plane to the {112} zones. The estimated stresses at the contact area were a few tens of a gigapascal and this finding related either to the interfacial friction when the tip was separated from metal plates or to the increased area of contact due to high surface energies of clean metals. An identification of the atomic structures of tribology materials as MoS2, Si and C-60 is also described.
引用
收藏
页码:1319 / 1327
页数:9
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