Characteristics of AP bias in spin valve memory elements

被引:40
作者
Zhu, JG [1 ]
Zheng, YF [1 ]
机构
[1] Carnegie Mellon Univ, Dept Elect & Comp Engn, DSSC, Pittsburgh, PA 15213 USA
基金
美国国家科学基金会;
关键词
spin valve MRAM; synthetic antiferromagnet;
D O I
10.1109/20.706357
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Spin valve memory element biased with a pair of antiparallel,(AP) coupled ferromagnetic layer was analyzed and modeled via micromagnetic simulation. In an AP structure, an external field results in a torque, causing the antiparallel magnetization (AP) axis to rotate towards the direction orthogonal to the field. In addition, due to its strength difference between the two AP layers, the magnetostatic field from the free layer of the spin valve can lead to irreversible AP axis flipping. This irreversible flipping can be effectively prevented by applying an AF/F exchange pinning to one of the AP layers to overcome the differential field from the free layer.
引用
收藏
页码:1063 / 1065
页数:3
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