A scanning transmission x-ray microscope for materials science spectromicroscopy at the advanced light source

被引：92

作者：

Warwick, T ^{[1
]}

Franck, K

Kortright, JB

Meigs, G

Moronne, M

Myneni, S

Rotenberg, E

Seal, S

Steele, WF

Ade, H

Garcia, A

Cerasari, S

Delinger, J

Hayakawa, S

Hitchcock, AP

Tyliszczak, T

Kikuma, J

Rightor, EG

Shin, HJ

Tonner, BP

机构：

[1] Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA

[2] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA

[3] Univ Trieste, I-34127 Trieste, Italy

[4] Univ Michigan, Ann Arbor, MI 48109 USA

[5] Univ Tokyo, Sch Engn, Tokyo 113, Japan

[6] Asahi Chem Ind Co Ltd, Fuji, Shizuoka 416, Japan

[7] Dow Chem Co, Midland, MI 48641 USA

[8] POSTECH, Pohang Accelerator Lab, Pohang 790784, South Korea

[9] Univ Wisconsin, Dept Phys, Milwaukee, WI 53211 USA

[10] McMaster Univ, Dept Chem, Hamilton, ON L8S 4M1, Canada

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1998年 / 69卷 / 08期

关键词：

D O I：

10.1063/1.1149041

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Design and performance of a scanning transmission x-ray microscope (STXM) at the Advanced Light Source is described. This instrument makes use of a high brightness undulator beamline and extends the STXM technique to new areas of research. After 2.5 years of development it is now an operational tool for research in polymer science, environmental chemistry, and magnetic materials. (C) 1998 American Institute of Physics.

引用

页码：2964 / 2973

页数：10

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