Fragile structured layers on surfaces in highly concentrated solutions of electrolytes of various valencies

被引:10
作者
Li, Y [1 ]
Kanda, Y [1 ]
Shinto, H [1 ]
Vakarelski, IU [1 ]
Higashitani, K [1 ]
机构
[1] Kyoto Univ, Dept Chem Engn, Nishikyo Ku, Kyoto 6158510, Japan
关键词
atomic force microscopy; fragile structured layer; electrolyte solution; approaching rate; short-range repulsive force;
D O I
10.1016/j.colsurfa.2005.02.016
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In the present study a dynamic mode of atomic force microscopy for force measurements was employed to investigate the hydration repulsion force between charged surfaces in highly concentrated electrolyte solutions of NaCl, MgCl2 and LaCl3. A strong dependence of this repulsive force on the approaching rate of surfaces, the prehistory of their contact and the valency of cations was demonstrated. The phenomena were strongly pronounced in the cases of high scan rates, large surfaces and cations of high valency. The results obtained indicate that a fragile structure composed of water molecules, ions and hydrated ions exists outside of the primary layer of water molecules and ions adsorbed firmly on surfaces. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:39 / 43
页数:5
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