Effect of the sheath resistivity and tape geometry on eddy current loss in Bi(2223) tapes

被引：5

作者：

Nibbio, N ^{[1
]}

Stavrev, S ^{[1
]}

Dutoit, B ^{[1
]}

机构：

[1] Ecole Polytech Fed Lausanne, Swiss Fed Inst Technol, DE CIRC, CH-1015 Lausanne, Switzerland

来源：

PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS | 1998年 / 310卷 / 1-4期

关键词：

Bi(2223) tape; eddy current loss; finite-element-method;

D O I：

10.1016/S0921-4534(98)00463-8

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have made a software electromagnetic simulation of eddy current effects in Bi(2223)Ag sheathed tapes with applied AC transport current in a broad frequency range. We have used simple models of monocore and multicore tapes. Calculated is the power distribution (W/m(3)) within the metal sheath using the geometry of real tapes. The numerical simulation is carried out with Finite-element-method software. The paper also describes the influence of the tape cross-sectional architecture and the sheath resistivity on the eddy current loss. (C) 1998 Published by Elsevier Science B.V. All rights reserved.

引用

页码：208 / 212

页数：5

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