Nearly zero temperature coefficient of resistivity in antiperovskite compound CuNMn3

被引:262
作者
Chi, EO [1 ]
Kim, WS [1 ]
Hur, NH [1 ]
机构
[1] Korea Res Inst Stand & Sci, Ctr CMR Mat, Taejon 305600, South Korea
关键词
chemical synthesis; crystal structure and symmetry; electronic transport; neutron scattering;
D O I
10.1016/S0038-1098(01)00395-7
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
The temperature dependent structural, magnetic, and transport properties of a Mn-based compound CuNMn3 with an antiperovskite structure were investigated. A ferrimagnetic transition occurs near 150 K, which coincides with the structural transition temperature from cubic to tetragonal symmetry. Below 150 K, the resistivity of this compound shows a metallic behavior. Above 150 K, however, the variation of resistivity with temperature is almost negligible, exhibiting nearly zero temperature coefficient of resistivity (TCR). Its TCR value is about 46 pprn/K near room temperature, which is about two orders of magnitude smaller than those of pure metals like Cu and Al. (C) 2001 Published by Elsevier Science Ltd.
引用
收藏
页码:307 / 310
页数:4
相关论文
共 12 条
[1]   Adjustment of temperature coefficient of resistance in NiCr/CuNi(Mn)/NiCr films [J].
Bruckner, W ;
Baunack, S ;
Elefant, D ;
Reiss, G .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (11) :8516-8520
[2]  
Dhere N. G., 1970, Journal of Vacuum Science and Technology, V7, P588, DOI 10.1116/1.1315883
[3]   MAGNETIC STUDIES OF METALLIC PEROVSKITE-TYPE COMPOUNDS OF MANGANESE [J].
FRUCHART, D ;
BERTAUT, EF .
JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1978, 44 (03) :781-791
[4]   THOUSANDFOLD CHANGE IN RESISTIVITY IN MAGNETORESISTIVE LA-CA-MN-O FILMS [J].
JIN, S ;
TIEFEL, TH ;
MCCORMACK, M ;
FASTNACHT, RA ;
RAMESH, R ;
CHEN, LH .
SCIENCE, 1994, 264 (5157) :413-415
[5]  
Kittel C., 2018, Introduction to solid state physics, V8th
[6]   STRUCTURAL AND ELECTRICAL PROPERTIES OF SPUTTERED CRNI FILMS [J].
MOOIJ, JH ;
DEJONG, M .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1972, 9 (01) :446-&
[7]   CALCULATED THERMAL-PROPERTIES OF METALS [J].
MORUZZI, VL ;
JANAK, JF ;
SCHWARZ, K .
PHYSICAL REVIEW B, 1988, 37 (02) :790-799
[8]  
ROISNEL T, 2000, PROGRAM FULLPROF LLB
[9]   THE MEASUREMENT, USE AND INTERPRETATION OF THE TEMPERATURE-COEFFICIENT OF RESISTANCE OF METALLIZATIONS [J].
SCHAFFT, HA ;
SUEHLE, JS .
SOLID-STATE ELECTRONICS, 1992, 35 (03) :403-410
[10]  
Tokura Y, 2000, ADV COND MAT SCI, V2, P1