Influence of process parameters on CNx films obtained by laser-CVD at two wavelengths

被引:7
作者
Cireasa, R
Crunteanu, A
Alexandrescu, R
Morjan, I
Martin, C
Mihailescu, IN
Oncioiu, G
机构
[1] Natl Inst Lasers Plasma & Radiat Phys, Lasers Dept, Bucharest, Romania
[2] Inst Nucl Res, Pitesti, Romania
关键词
photoelectron spectroscopy;
D O I
10.1016/S0008-6223(98)00020-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The carbon nitride (CN,) films have been prepared by infrared (IR, at 10.6 mu m) and ultraviolet (at 248 nm) laser induced chemical vapour deposition (CVD) using different ethylene/nitrous oxide/ammonia mixtures. The partial concentration of ammonia in mixtures was varied in order to obtain a higher nitrogen incorporation in the deposited films. The changes induced in the gas-phase composition by the laser radiation in different experimental conditions were determined by IR transmission measurements. The film composition was studied by X-ray photoelectron spectroscopy. The modification of the film chemical composition, specifically the dependence of the N/C ratio, on the irradiation wavelength and on the reactants composition is described for the first time. (C) 1998 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:775 / 780
页数:6
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