Quantitative Rietveld texture analysis of zirconium from single synchrotron diffraction images

被引：83

作者：

Ischia, G

Wenk, HR ^{[1
]}

Lutterotti, L

Berberich, F

机构：

[1] Univ Calif Berkeley, Dept Earth & Planetary Sci, Berkeley, CA 94720 USA

[2] Univ Trent, Dipartimento Ingn Mat, I-38050 Trento, Italy

[3] Geoforschungszentrum Potsdam, D-14473 Potsdam, Germany

[4] European Synchrotron Radiat Facil, F-38043 Grenoble, France

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2005年 / 38卷

关键词：

D O I：

10.1107/S0021889805006059

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Preferred orientation is immediately visible on synchrotron diffraction images as intensity variations along Debye rings. In this report, the Rietveld method is applied to obtain quantitative information about the orientation distribution from the analysis of a single synchrotron diffraction image. The method is illustrated for hexagonal cold-rolled zirconium, investigated in situ in a vacuum furnace with high-energy X-rays, both before and after the onset of recrystallization.

引用

页码：377 / 380

页数：4

共 15 条

[1] Microtexture analysis by synchrotron-radiation X-ray diffraction of nickel-iron alloys prepared by microelectroplating [J].