Characterization of cobalt nanowires by means of force microscopy

被引：16

作者：

Garcia, JM ^{[1
]}

Asenjo, A

Vazquez, M

Aranda, P

Ruiz-Hitzky, E

机构：

[1] UCM, RENFE, Inst Magnetismo Aplicado, Madrid 28230, Spain

[2] CSIC, ICMM, Madrid 28230, Spain

[3] CSIC, Inst Ciencia Mat, E-28049 Madrid, Spain

来源：

IEEE TRANSACTIONS ON MAGNETICS | 2000年 / 36卷 / 05期

关键词：

nanowires; electrodeposition; magnetic microscopy and imaging;

D O I：

10.1109/20.908647

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, an experimental study on both the electrolytic growth and the magnetic properties of cobalt nanowires is presented, The wires were electrodeposited into the pores of track-etched polymer membranes, having a diameter ranging from 80 up to 250 nm depending on the size of the pores. The filling of the pores was monitored combining the measurement of the electrolytic current-time curves with Atomic Forte Microscopy imaging (AFM), After dissolving the membranes, the magnetic domain structure of isolated nanowires was visualized by means of Magnetic Force Microscopy (MFM) showing a multidomain pattern, The results are analyzed considering that the c axis of the hcp-Co crystallites is mainly perpendicular to the wire axis.

引用

页码：2981 / 2983

页数：3

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