Detecting simulation of attention deficits using reaction time tests

The current study examined if a newly developed series of reaction time tests, the Computerized Tests of Information Processing (CTIP) [Tombaugh, T. N., & Rees, L. (2000). Manual for the Computerized Tests of Information Processing (CTIP). Ottawa, Ontario: Carleton University (unpublished test)], were sensitive to simulation of attention deficits commonly caused by traumatic brain injury (TBI). The CTIP consists of three reaction time tests: Simple RT, Choice RT, and Semantic Search RT. These tests were administered to four groups: Control, Simulator, Mild TBI, and Severe TBI. Individuals attempting to simulate attention deficits produced longer reaction time scores, made more incorrect responses, and exhibited greater variability than cognitively-intact individuals and those with TBI. Sensitivity and specificity values were comparable or exceeded those obtained on the Test of Memory Malingering [Tombaugh, T. N. (1996). The Test of Memory Malingering (TOMM). Toronto, Canada: Multi-Health Systems Inc.]. As such, the CTIP offers considerable promise of serving as a viable malingering test that uses a distinctively different paradigm than the two-item, forced-choice procedure employed by traditional symptom validity tests. (c) 2005 National Academy of Neuropsychology. Published by Elsevier Ltd. All rights reserved.