Microstructure degradation of an anode/electrolyte interface in SOFC studied by transmission electron microscopy

被引:97
作者
Liu, YL
Jiao, CG
机构
[1] Riso Natl Lab, Dept Mat Res, DK-4000 Roskilde, Denmark
[2] FEI UK Ltd, Focused Ion Beam Lab, Aztec W Ctr, Bristol BS32 4TD, Avon, England
关键词
TEM; FIB; interface; SOFC;
D O I
10.1016/j.ssi.2004.08.018
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This work is one of the first attempts of using focused ion beam/lift-out (FIB/lift-out) techniques to prepare TEM specimens containing electrode/electrolyte interfaces in solid oxide fuel cells (SOFC). The present specimen was made from an Ni+YSZ (anode)/YSZ (electrolyte) half-cell which has undergone a long-term testing at a temperature of 850 degreesC over 1800 h in H-2 with 1% to 3% H2O under an anodic load of 300 mA cm(-2). The microstructure and phase chemistry in the interfacial region was analyzed using a JEM-3000F and EDS with a lateral resolution of nanometers. The impurity phase accumulated at the interface seen earlier by SEM have been characterized. It is a silicate glass with an amorphous structure and a composition of similar to90 mol% SiO2 as well as a few percent of Na2O,CaO, ZrO2, V2O3 etc. The silicate glass phase is distributed as films of nanoscale along the anode/electrolyte interface and Ni/YSZ grain boundaries. Its influence on the microstructural degradation of the interfacial region is evaluated. The FIB/lift-out techniques have been shown to be viable for specimen preparation from SOFC interface. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:435 / 442
页数:8
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