Deformed substructures in fine-grained tetragonal zirconia

Transmission electron microscopy (TEM) has been employed to examine the deformed microstructures of a high-purity tetragonal zirconia polycrystal containing 3 mol% yttria. The TEM observations reveal that piled-up and tangled dislocations are developed within grains at a high stress, but such substructures do not appear at a lower stress, except for a small number of isolated dislocations. The stress-dependent deformed microstructures suggest that the dislocation substructures observed at a high stress are not due to any experimental artefacts. Applying a model proposed by Eshelby et al. to the observed pile-up dislocations, it can be estimated that a stress concentration of the order of 14-25 is generated around multiple-grain junctions during deformation.