Evidence for interactions in nonergodic electronic transport

被引：108

作者：

Vaknin, A ^{[1
]}

Ovadyahu, Z

Pollak, M

机构：

[1] Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

[2] Univ Calif Riverside, Dept Phys, Riverside, CA 92521 USA

来源：

PHYSICAL REVIEW LETTERS | 1998年 / 81卷 / 03期

关键词：

D O I：

10.1103/PhysRevLett.81.669

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

It is shown that the nonergodic effects observed in field-effect experiments on insulating indium-oxide films las well as in other Anderson insulators) depend in a systematic manner on the carrier concentration n. The results are interpreted as evidence for interactions.

引用

页码：669 / 672

页数：4

共 17 条

[1] POTENTIAL DISORDER IN GRANULAR METAL SYSTEMS - THE FIELD-EFFECT IN DISCONTINUOUS METAL-FILMS [J].

ADKINS, CJ ;

BENJAMIN, JD ;

THOMAS, JMD ;

GARDNER, JW ;

MCGEOWN, AJ .

JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1984, 17 (26) :4633-4644

[2]

[Anonymous], J PHYS C SOLID STATE

[3] NONEQUILIBRIUM TRANSPORT AND SLOW RELAXATION IN HOPPING CONDUCTIVITY [J].

BENCHORIN, M ;

OVADYAHU, Z ;

POLLAK, M .

PHYSICAL REVIEW B, 1993, 48 (20) :15025-15034

[4] ELECTRODE SCREENING OF THE COULOMB GAP [J].

CUEVAS, E ;

ORTUNO, M ;

RUIZ, J ;

GASPARIAN, V ;

POLLAK, M .

PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1994, 70 (06) :1231-1235

[5] PROPERTIES OF THE ELECTRON GLASS [J].

DAVIES, JH ;

LEE, PA ;

RICE, TM .

PHYSICAL REVIEW B, 1984, 29 (08) :4260-4271

[6] ELECTRON GLASS [J].

DAVIES, JH ;

LEE, PA ;

RICE, TM .

PHYSICAL REVIEW LETTERS, 1982, 49 (10) :758-761

[7] UNEXPECTED ACTIVATED TEMPERATURE-DEPENDENCE OF THE CONDUCTANCE IN THE PRESENCE OF A SOFT COULOMB GAP IN 3 DIMENSIONS [J].

LI, QM ;

PHILLIPS, P .

PHYSICAL REVIEW B, 1994, 49 (15) :10269-10277

[8] Anomalous field effect in ultrathin films of metals near the superconductor-insulator transition [J].

MartinezArizala, G ;

Grupp, DE ;

Christiansen, C ;

Mack, AM ;

Markovic, N ;

Seguchi, Y ;

Goldman, AM .

PHYSICAL REVIEW LETTERS, 1997, 78 (06) :1130-1133

[9] LONG-LIVED COULOMB GAP IN A COMPENSATED SEMICONDUCTOR - THE ELECTRON GLASS [J].

MONROE, D ;

GOSSARD, AC ;

ENGLISH, JH ;

GOLDING, B ;

HAEMMERLE, WH ;

KASTNER, MA .

PHYSICAL REVIEW LETTERS, 1987, 59 (10) :1148-1151

[10]

MOTT NF, 1979, ELECT PROCESSES NONC, P245

← 1 2 →