Transient deformation measurement with electronic speckle pattern interferometry and a high-speed camera

被引：75

作者：

Moore, AJ ^{[1
]}

Hand, DP ^{[1
]}

Barton, JS ^{[1
]}

Jones, JDC ^{[1
]}

机构：

[1] Heriot Watt Univ, Dept Phys, Edinburgh EH14 4AS, Midlothian, Scotland

来源：

APPLIED OPTICS | 1999年 / 38卷 / 07期

关键词：

D O I：

10.1364/AO.38.001159

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

To the best of our knowledge, transient deformations have been measured in real. time with microsecond temporal resolution for the first time with speckle pattern interferometry. The short exposure period and high framing rate of a high-speed camera at as many as 40,500 frames per second allow low-power continuous-wave laser illumination and fiber-optic beam delivery to be used. We have applied the technique to measure both harmonic vibration and transient deformation. (C) 1999 Optical Society of America.

引用

页码：1159 / 1162

页数：4

共 11 条

[1] DYNAMIC HOLOGRAPHIC-ELECTRONIC SPECKLE-PATTERN INTERFEROMETRY [J].

AHMADSHAHI, MA ;

KRISHNASWAMY, S ;

NEMATNASSER, S .

JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1993, 60 (04) :866-874

[2] ELECTRONIC SPECKLE PATTERN INTERFEROMETRY USING DIODE-LASER STROBOSCOPIC ILLUMINATION [J].

ANDERSON, DJ ;

VALERA, JD ;

JONES, JDC .

MEASUREMENT SCIENCE AND TECHNOLOGY, 1993, 4 (09) :982-987

[3] HOLOGRAPHIC STUDY OF PROPAGATING TRANSVERSE WAVES IN PLATES [J].

APRAHAMIAN, R ;

EVENSEN, DA ;

MIXSON, JS ;

JACOBY, JL .

EXPERIMENTAL MECHANICS, 1971, 11 (08) :357-+

[4]

BROWN GM, 1989, P SOC PHOTO-OPT INS, V1162, P36

[5] PULSED LASERS IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY [J].

COOKSON, TJ ;

BUTTERS, JN ;

POLLARD, HC .

OPTICS AND LASER TECHNOLOGY, 1978, 10 (03) :119-124

[6] Study of transient deformations with pulsed TV holography: Application to crack detection [J].

Fernandez, A ;

Moore, AJ ;

PerezLopez, C ;

Doval, AF ;

BlancoGarcia, J .

APPLIED OPTICS, 1997, 36 (10) :2058-2065

[7]

Jones R., 1989, HOLOGRAPHIC SPECKLE, DOI DOI 10.1017/CBO9780511622465

[8]

Moore AJ, 1996, J MOD OPTIC, V43, P1829, DOI 10.1080/09500349608232854

[9] EFFECT AND USE OF EXPOSURE CONTROL IN VIBRATION ANALYSIS USING TV HOLOGRAPHY [J].

ROSVOLD, GO ;

LOKBERG, OJ .

APPLIED OPTICS, 1993, 32 (05) :684-691

[10] DETERMINATION OF VIBRATION PHASE WITH ELECTRONIC SPECKLE PATTERN INTERFEROMETRY (ESPI) [J].

VALERA, JD ;

DOVAL, AF ;

JONES, JDC .

ELECTRONICS LETTERS, 1992, 28 (25) :2292-2294

← 1 2 →