Hyperspectral crop reflectance data for characterising and estimating fungal disease severity in wheat

Many studies have shown the usefulness of hyperspectral crop reflectance data for detecting plant pathological stress. However, there is still a need to identify unique signatures for specific stresses amidst the constantly changing background associated with normal crop growth and development. Comparing spatial and temporal patterns in crop spectra can provide such signatures. This work was concerned with characterising and estimating fungal disease severity in a spring wheat crop. This goal can be accomplished by using a reference data set consisting of hyperspectral crop reflectance data vectors and the corresponding disease severity field assessments. The hyperspectral vectors were first normalised into zero-mean and unit-variance vectors by performing various combinations of spectral- and band-wise normalisations. Then, after applying the same normalisation procedures to the new hyperspectral data, a nearest-neighbour classifier was used to classify the new data against the reference data. Finally, the corresponding stress signatures were computed using a linear transformation model. High correlation was obtained between the classification results and the corresponding field assessments of fungal disease severity, confirming the usefulness and efficiency of this approach. The effects of increased disease severity could be characterised by analysing the resulting disease signatures obtained when applying the different normalisation procedures. The low computational load of this approach makes it suitable for real-time on-vehicle applications. (c) 2005 Silsoe Research Institute. All rights reserved Published by Elsevier Ltd.