Absolute calibration of image plates for electrons at energy between 100 keV and 4 MeV

被引：58

作者：

Chen, Hui ^{[1
]}

Back, Norman L. ^{[1
]}

Bartal, Teresa ^{[3
]}

Beg, F. N. ^{[3
]}

Eder, David C. ^{[1
]}

Link, Anthony J. ^{[2
]}

MacPhee, Andrew G. ^{[1
]}

Ping, Yuan ^{[1
]}

Song, Peter M. ^{[1
]}

Throop, Alan ^{[1
]}

Van Woerkom, Linn ^{[2
]}

机构：

[1] Lawrence Livermore Natl Lab, Livermore, CA 94550 USA

[2] Ohio State Univ, Columbus, OH 43210 USA

[3] Univ Calif San Diego, La Jolla, CA 92093 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2008年 / 79卷 / 03期

关键词：

D O I：

10.1063/1.2885045

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We measured the absolute response of image plate (Fuji BAS SR2040) for electrons at energies between 100 keV and 4 MeV using an electron spectrometer. The electron source was produced from a short pulse laser irradiated on solid density targets. This paper presents the calibration results of image plate photon stimulated luminescence per electron at this energy range. The Monte Carlo radiation transport code MCNPX results are also presented for three representative incident angles onto the image plates and corresponding electron energy depositions at these angles. These provide a complete set of tools that allows extraction of our absolute calibration to other spectrometer setting at this electron energy range. (C) 2008 American Institute of Physics.

引用

页数：4

共 9 条

[1] IMAGING PLATE ILLUMINATES MANY FIELDS [J].