Design of the National Ignition Facility static x-ray imager

被引:28
作者
Landon, MD
Koch, JA
Alvarez, SS
Bell, PM
Lee, FD
Moody, JD
机构
[1] Univ Calif Lawrence Livermore Natl Lab, Livermore, CA 94551 USA
[2] Bechtel Nevada Livermore Operat, Livermore, CA 94550 USA
关键词
D O I
10.1063/1.1318255
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Two static x-ray imagers (SXI) will be used to monitor beam pointing on all target shots in the National Ignition Facility. These pinhole-based instruments will provide time integrated two-dimensional images of target x-ray emissions in the energy range between 2 and 3 keV. These instruments are not DIM based and will view along dedicated lines of sight from near the top and bottom ports of the target chamber. Beams that miss or clip the hohlraum laser-entrance holes will produce x-ray emission on the ends of the hohlraum, indicating improper beam pointing and/or target positioning. The SXIs will also be used to quantify beam focusing and pointing by producing x-ray images of dedicated test targets irradiated by focused beams at precalculated positions. A proposed design is presented, along with supporting data from NOVA target experiments. (C) 2001 American Institute of Physics.
引用
收藏
页码:698 / 700
页数:3
相关论文
共 4 条
[1]   COMPOSITE X-RAY PINHOLES FOR TIME-RESOLVED MICROPHOTOGRAPHY OF LASER COMPRESSED TARGETS [J].
ATTWOOD, DT ;
WEINSTEIN, BW ;
WUERKER, RF .
APPLIED OPTICS, 1977, 16 (05) :1253-1259
[2]   DIAGNOSTIC SYSTEMS FOR THE NATIONAL IGNITION FACILITY (NIF) (INVITED) [J].
KILKENNY, JD ;
CABLE, MD ;
CLOWER, CA ;
HAMMEL, BA ;
KARPENKO, VP ;
KAUFFMAN, RL ;
KORNBLUM, HN ;
MACGOWAN, BJ ;
OLSON, W ;
ORZECHOWSKI, TJ ;
PHILLION, DW ;
TIETBOHL, GL ;
TREBES, JE ;
CHRIEN, B ;
FAILOR, B ;
HAUER, A ;
HOCKADAY, R ;
OERTEL, J ;
WATT, R ;
RUIZ, C ;
COOPER, G ;
HEBRON, D ;
LEEPER, R ;
PORTER, J ;
KNAUER, J .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1995, 66 (01) :288-295
[3]   High-energy x-ray microscopy techniques for laser-fusion plasma research at the National Ignition Facility [J].
Koch, JA ;
Landen, OL ;
Barbee, TW ;
Celliers, P ;
Da Silva, LB ;
Glendinning, SG ;
Hammel, BA ;
Kalantar, DH ;
Brown, C ;
Seely, J ;
Bennett, GR ;
Hsing, W .
APPLIED OPTICS, 1998, 37 (10) :1784-1795
[4]  
*NIF CDR, 1994, UCRLPROP117093 NIF C, V3