Crystallinity-damage recovery and optical property of As-implanted Zno crystals by post-implantation annealing

被引:18
作者
Jeong, TS
Han, MS
Kim, JH
Youn, CJ [1 ]
Ryu, YR
White, HW
机构
[1] Chonbuk Natl Univ, SPRC, Jeonju 561756, South Korea
[2] Univ Missouri, Dept Phys & Astron, Columbia, MO 65211 USA
关键词
characterization; crystallinity recovery; ion implantation; thermal annealing; semiconducting II-VI materials;
D O I
10.1016/j.jcrysgro.2004.12.043
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Since As doping in ZnO using ion implantation must always follow a damage caused by the energetic As ion penetration, there is a growing demand for crystallinity recovery from the surface damage through the post-implantation annealing. The results obtained from our experiments using double crystal X-ray diffraction and the atomic force microscopy indicate that the crystallinity recovery of the As-implanted sample presents the optimum condition when it is annealed at 800 degrees C for 1 h. From the Raman and photoluminescence measurements through the post-implantation annealing, the As-related optical properties were observed in As-implanted ZnO crystals. Thereby, we confirmed that the surface of the unimplanted ZnO was clearly converted into As-doped p-type ZnO layer by As ions. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:541 / 547
页数:7
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