Focus wave modes at a dielectric interface

被引：9

作者：

Hillion, P ^{[1
]}

机构：

[1] Inst Henri Poincare, F-78110 Le Vesinet, France

来源：

JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE | 1998年 / 29卷 / 05期

关键词：

focus wave mode; reflection; refraction;

D O I：

10.1088/0150-536X/29/5/005

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We analyse the behaviour of a focus wave mode incident on a dielectric plane. The Descartes-Snell law is valid for the reflected beam but the refracted beam undergoes a Goos-Hanken shift and propagates in the direction of the incident focus wave mode. The Fresnel coefficients do not depend on the angle of incidence.

引用

页码：345 / 347

页数：3

共 14 条

[1]

Arnaud J. A., 1976, Beam and Fiber Optics

[2]

BORISOV V, 1993, J PHYS A, V26, P406

[3]

BORN M, 1965, PRINCIPLES OPTICS

[4] FOCUS WAVES MODES IN HOMOGENEOUS MAXWELL EQUATIONS - TRANSVERSE ELECTRIC MODE [J].