Characterization of dielectric particles by impedance Spectroscopy (Part 1)

被引:17
作者
Petrovsky, Vladimir [1 ]
Petrovsky, Tatiana [1 ]
Kamlapurkar, Swetha [1 ]
Dogan, Fatih [1 ]
机构
[1] Missouri Univ Sci & Technol, Dept Mat Sci & Engn, Rolla, MO 65409 USA
关键词
D O I
10.1111/j.1551-2916.2007.02255.x
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Impedance spectroscopy is an effective method to investigate physical properties of multicomponent systems so that contributions of individual components can be extracted from different sections of the spectra, which is frequency dependent. Slurries can be considered as 0-3 mixed systems containing a host liquid and dispersed particles. It was shown that low-frequency part of impedance spectra is sensitive to dielectric properties of dispersed particles. Applicability of this technique was extended using various dielectric powders dispersed in appropriate liquids. Characterization of slurries by impedance spectroscopy through applying of equivalent circuit models allows a reliable measurement of dielectric constant of particulate materials and liquids.
引用
收藏
页码:1814 / 1816
页数:3
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