Atomic force microscopy of biomaterials surfaces and interfaces

被引:169
作者
Jandt, KD [1 ]
机构
[1] Univ Bristol, Biomed Engn & Biomat Sci Sect, Dept Oral & Dent Sci, Bristol BS1 2LY, Avon, England
关键词
surface structure; morphology; roughness. and topography; biological molecules - proteins; titanium; etching; surface chemical reaction; physical adsorption; solid-liquid interfaces;
D O I
10.1016/S0039-6028(01)01296-1
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The use of atomic force microscopy (AFM) in biomaterials science and engineering applications has increased rapidly over the last few years. Beyond being merely a tool for measuring surface topography, AFM has made significant contributions to various biomaterials research areas dealing with the structure, properties, dynamics and manipulation of biomaterials surfaces and interfaces. This paper critically reviews methodological approaches and presents aspects of this research. Selected examples presented include micro and nanostructure and properties of biomaterials surfaces, molecular level interactions at biomaterial-biomolecule interfaces, interfaces between biomaterials and mineralised tissues as well as advances of mineralised tissue research. In these areas, AFM is shown to be a useful and versatile tool to study micro and nanostructure, to probe mechanical properties or to investigate dynamic process at biomaterials surfaces and interfaces. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:303 / 332
页数:30
相关论文
共 172 条
[1]   MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].
ALBRECHT, TR ;
AKAMINE, S ;
CARVER, TE ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3386-3396
[2]  
Balooch M, 1998, J BIOMED MATER RES, V40, P539, DOI 10.1002/(SICI)1097-4636(19980615)40:4<539::AID-JBM4>3.3.CO
[3]  
2-O
[4]  
Baretzky B, 1996, Z METALLKD, V87, P332
[5]   IMAGING SPECTROSCOPY WITH THE ATOMIC-FORCE MICROSCOPE [J].
BASELT, DR ;
BALDESCHWIELER, JD .
JOURNAL OF APPLIED PHYSICS, 1994, 76 (01) :33-38
[6]   NANOINDENTATION HARDNESS MEASUREMENTS USING ATOMIC-FORCE MICROSCOPY [J].
BHUSHAN, B ;
KOINKAR, VN .
APPLIED PHYSICS LETTERS, 1994, 64 (13) :1653-1655
[7]   Nanoindentation and picoindentation measurements using a capacitive transducer system in atomic force microscopy [J].
Bhushan, B ;
Kulkarni, AV ;
Bonin, W ;
Wyrobek, JT .
PHILOSOPHICAL MAGAZINE A-PHYSICS OF CONDENSED MATTER STRUCTURE DEFECTS AND MECHANICAL PROPERTIES, 1996, 74 (05) :1117-1128
[8]  
BINNIG G, 1986, IBM J RES DEV, V30, P355
[9]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[10]   SINGLE-TUBE 3-DIMENSIONAL SCANNER FOR SCANNING TUNNELING MICROSCOPY [J].
BINNIG, G ;
SMITH, DPE .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1986, 57 (08) :1688-1689