A direct test of x-ray magnetic circular dichroism sum rules for strained Ni films using polarized neutron reflection

被引：16

作者：

Lee, J

Lauhoff, G

Fermon, C

Hope, S

Bland, JAC

Schille, JP

vanderLaan, G

Chappert, C

Beauvillain, P

机构：

[1] CEA SACLAY,SPEC,DRECAM,F-91191 GIF SUR YVETTE,FRANCE

[2] UNIV YORK,DEPT PHYS,YORK YO1 5DD,N YORKSHIRE,ENGLAND

[3] SERC,DARESBURY LAB,WARRINGTON WA4 4AD,CHESHIRE,ENGLAND

[4] UNIV PARIS 11,IEF,F-91405 ORSAY,FRANCE

来源：

JOURNAL OF PHYSICS-CONDENSED MATTER | 1997年 / 9卷 / 09期

关键词：

D O I：

10.1088/0953-8984/9/9/005

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We have directly compared the values of the magnetic moment obtained from x-ray magnetic circular dichroism (XMCD) measurements with those obtained from polarized neutron reflection (PNR) measurements on strained Ni films grown on Cu(001)/Si(001). The PNR measurements show that the absolute magnetic moments differ from that of bulk Ni. We find agreement within experimental errors between the two magnetometry measurements, confirming that the XMCD sum rules are applicable to this strained low-symmetric system.

引用

页码：L137 / L143

页数：7

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