Compensation effects in Mg-doped GaN epilayers

被引:36
作者
Eckey, L
Von Gfug, U
Holst, J
Hoffmann, A
Schineller, B
Heime, K
Heuken, M
Schon, O
Beccard, R
机构
[1] Tech Univ Berlin, Inst Festkorperphys, D-10623 Berlin, Germany
[2] Rhein Westfal TH Aachen, Inst Halbleitertech, D-52056 Aachen, Germany
[3] AIXTRON AG, D-52072 Aachen, Germany
关键词
GaN; P-doping; compensation; photoluminescence; deep levels;
D O I
10.1016/S0022-0248(98)00344-3
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The compensation of Mg-doped GaN is systematically studied by low-temperature photoluminescence (PL) using a series of samples with different Mg concentrations. Strongly doped samples are found to be highly compensated in electrical measurements. The compensation mechanism is directly related to the incorporation of Mg. Three different deep donor levels are found at 240 +/- 30, 350 +/- 30 and 850 +/- 30 meV from the conduction band. With increasing excitation density in photoluminescence measurements these levels are subsequently neutralized giving rise to a Jeep unstructured donor-acceptor pair (DAP) emission. These emissions exhibit a blueshift that saturates at higher densities, thus excluding band fluctuations as the prime mechanism for the low energy of the observed DAP bands. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:523 / 527
页数:5
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