In-situ imaging of Langmuir monolayers by second-harmonic microscopy

被引:18
作者
Florsheimer, M
Raduge, C
Salmen, H
Bosch, M
Terbrack, R
Fuchs, H
机构
[1] Physical Institute, University of Münster, D-48149 Münster
关键词
second-harmonic microscopy; non-linear optics; crystal structure; domain properties;
D O I
10.1016/S0040-6090(95)08415-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Langmuir monolayers are imaged in situ with a non-scanning second-harmonic mic
引用
收藏
页码:659 / 662
页数:4
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