Efficiency and noise measurements of non-uniformly irradiated double-sided silicon strip detectors

被引：15

作者：

Dubbs, T

Kashigin, S

Kratzer, M

Kroeger, W

Pulliam, T

Sadrozinski, HFW

Schwab, M

Spencer, E

Wichmann, R

Wilder, M

Unno, Y

Ohsugi, T

机构：

[1] NATL LAB HIGH ENERGY PHYS,KEK,TSUKUBA,IBARAKI 305,JAPAN

[2] HIROSHIMA UNIV,HIROSHIMA,JAPAN

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1996年 / 383卷 / 01期

关键词：

D O I：

10.1016/S0168-9002(96)00749-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have investigated the efficiency and the noise occupancy of double-sided silicon strip detectors, which were subjected to non-uniform proton irradiation of fluences up to a maximum of equivalent 5 x 10(13) protons/cm(2). The depletion voltages, varying over time due to controlled annealing, were close to zero on one end of the 6 cm strips and 190 V at the high radiation end. We determined the efficiency and noise occupancy on both n-side and p-side in a Ru-106 telescope, using a binary read-out system with 22 ns shaping time. The n-side exhibits superior performance after type inversion.

引用

页码：174 / 178

页数：5

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