Method to determine the spring constant of atomic force microscope cantilevers

We present a method for determining the spring constant of atomic force microscope cantilevers that involves a simple expression that relates the spring constant of any two cantilevers on the same chip. The method requires only the measurement of the resonant frequency and the plan view surface area of the cantilevers. One limitation, however, is that one cantilever on the chip must have its spring constant determined accurately using another technique. The method itself is simple, easy to use and can potentially provide accuracy on the order of 10% or better. (C) 2004 American Institute of Physics.