TEMPO: a New Insertion Device Beam line at SOLEIL for Time Resolved Photoelectron Spectroscopy Experiments on Solids and Interfaces

被引：99

作者：

Polack, F. ^{[1
]}

Silly, M. ^{[1
]}

Chauvet, C. ^{[1
]}

Lagarde, B. ^{[1
]}

Bergeard, N. ^{[1
]}

Izquierdo, M. ^{[1
]}

Chubar, O. ^{[1
]}

Krizmancic, D. ^{[1
]}

Ribbens, M. ^{[1
]}

Duval, J-P. ^{[1
]}

Basset, C. ^{[1
]}

Kubsky, S. ^{[1
]}

Sirotti, F. ^{[1
]}

机构：

[1] Synchrotron SOLEIL, F-91192 Gif Sur Yvette, France

来源：

SRI 2009: THE 10TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION | 2010年 / 1234卷

关键词：

D O I：

10.1063/1.3463169

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A new insertion device beamline is now operational on straight section 8 at the SOLEIL synchrotron radiation source in France. The beamline and the experimental station were developed to optimize the study of the dynamics of electronic and magnetic properties of materials. Here we present the main technical characteristics of the installation and the general principles behind them. The source is composed of two APPLE II type insertion devices. The monochromator with plane gratings and spherical mirrors is working in the energy range 40 - 1500 eV. It is equipped with VLS, VGD gratings to allow the user optimization of flux or higher harmonics rejection. The observed resonance structures measured in gas phase enable us to determine the available energy resolution: a resolving power higher than 10000 is obtained at the Ar 2p, N 1s and Ne K-edges when using all the optical elements at full aperture. The total flux as a function of the measured photon energy and the characterization of the focal spot size complete the beamline characterization.

引用

页码：185 / 188

页数：4

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