X-ray diffraction tomography using interference effects

被引：15

作者：

Barroso, RC

Lopes, RT

Goncalves, OD

de Assis, JT

机构：

[1] Univ Fed Rio de Janeiro, COPPE, Lab Instrumentacao Nucl, BR-21945970 Rio De Janeiro, Brazil

[2] Univ Estado Rio de Janeiro, Inst Fis, Rio De Janeiro, Brazil

[3] Univ Fed Rio de Janeiro, Inst Fis, Rio De Janeiro, Brazil

[4] Univ Estado Rio de Janeiro, IPRJ, Rio De Janeiro, Brazil

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 1998年 / 418卷 / 2-3期

关键词：

computed tomography; X-ray diffraction; coherent scattering; interference; tomographic image;

D O I：

10.1016/S0168-9002(98)00759-1

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

When the electromagnetic wave excites more than one electron, the coherent scatter from different electrons gives rise to interference effects. X-rays scattered from a crystalline solid can constructively interfere, producing a diffracted beam at well-defined Bragg angles. The aim of this work is to describe a new imaging method based on the detection of diffracted X-rays. Diffraction patterns of polycrystalline solids (lead, silver and copper) were measured. A selective discrimination of a given element in a scanned specimen can be realized by fixing the Bragg angle which produces an interference peak and then, to carry out the computed tomography in the standard mode. The images obtained show the feasibility of this selective tomography. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：458 / 464

页数：7

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