Polarization phase-based method for material classification in computer vision

被引:62
作者
Chen, H [1 ]
Wolff, LB [1 ]
机构
[1] Johns Hopkins Univ, Dept Comp Sci, Comp Vis Lab, Baltimore, MD 21218 USA
关键词
material classification for image understanding; physics-based image understanding; automatic target recognition; inspection;
D O I
10.1023/A:1008054731537
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
A robust and accurate polarization phase-based technique for material classification is presented. The novelty of this technique is three-fold in (i) its theoretical development, (ii) application, and, (iii) experimental implementation. The concept of phase of polarization of a light wave is introduced to computer vision for discrimination between materials according to their intrinsic electrical conductivity, such as distinguishing conducting metals, and poorly conducting dielectrics. Previous work has used intensity, color and polarization component ratios. This new method is based on the physical principle that metals retard orthogonal components of light upon reflection while dielectrics do not. This method has significant complementary advantages with respect to existing techniques, is computationally efficient, and can be easily implemented with existing imaging technology. Experiments for real circuit board inspection, nonconductive and conductive glass, and, outdoor object recognition have been performed to demonstrate its accuracy and potential capabilities.
引用
收藏
页码:73 / 83
页数:11
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