Tapping-mode tuning fork force sensing for near-field scanning optical microscopy

被引：77

作者：

Tsai, DP ^{[1
]}

Lu, YY ^{[1
]}

机构：

[1] Natl Chung Cheng Univ, Dept Phys, Chiayi 621, Taiwan

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 19期

关键词：

D O I：

10.1063/1.122558

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A tapping-mode tuning fork force-sensing method for near-field scanning optical microscope is reported. Use of the tapping-mode tuning fork with mechanically asymmetric excitation generates better stability and sensitivity than in the shear force mode. Comparison of force curves for the two methods demonstrate that the tapping-mode tuning fork method provides a simpler and more sensitive method for near-field measurements. The method is demonstrated by imaging a sample consisting of 500 nm standard polystyrene spheres on silica in both air and water. (C) 1998 American Institute of Physics. [S0003-6951)(98)02145-7].

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页码：2724 / 2726

页数：3

相关论文

共 10 条

[1] A phase-locked shear-force microscope for distance regulation in near-field optical microscopy [J].

Atia, WA ;

Davis, CC .

APPLIED PHYSICS LETTERS, 1997, 70 (04) :405-407

[2] Distance control in near-field optical microscopy with piezoelectrical shear-force detection suitable for imaging in liquids [J].

Brunner, R ;

Bietsch, A ;

Hollricher, O ;

Marti, O .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (04) :1769-1772

[3] Nonoptical tip sample distance control for scanning near-field optical microscopy [J].

Chuang, YH ;

Wang, CJ ;

Huang, JY ;

Pan, CL .

APPLIED PHYSICS LETTERS, 1996, 69 (22) :3312-3314

[4]

Gregor MJ, 1996, APPL PHYS LETT, V68, P307, DOI 10.1063/1.116068

[5] TAPPING MODE ATOMIC-FORCE MICROSCOPY IN LIQUIDS [J].

HANSMA, PK ;

CLEVELAND, JP ;

RADMACHER, M ;

WALTERS, DA ;

HILLNER, PE ;

BEZANILLA, M ;

FRITZ, M ;

VIE, D ;

HANSMA, HG ;

PRATER, CB ;

MASSIE, J ;

FUKUNAGA, L ;

GURLEY, J ;

ELINGS, V .

APPLIED PHYSICS LETTERS, 1994, 64 (13) :1738-1740

[6] A shear force feedback control system for near-field scanning optical microscopes without lock-in detection [J].

Hsu, JWP ;

McDaniel, AA ;

Hallen, HD .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1997, 68 (08) :3093-3095

[7] PIEZOELECTRIC TIP-SAMPLE DISTANCE CONTROL FOR NEAR-FIELD OPTICAL MICROSCOPES [J].

KARRAI, K ;

GROBER, RD .

APPLIED PHYSICS LETTERS, 1995, 66 (14) :1842-1844

[8] Near-field optical recording on the cyanine dye layer of a commercial compact disk-recordable [J].

Tsai, DP ;

Guo, WR .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1997, 15 (03) :1442-1445

[9]

ZHONG Q, 1993, SURF SCI LETT, V290, P688

[10] A novel ultrasonic resonance sample tip distance regulation for near field optical microscopy and shear force microscopy [J].

Zhu, X ;

Huang, GS ;

Zhou, HT ;

Dai, YD .

SOLID STATE COMMUNICATIONS, 1996, 98 (07) :661-664